Goal

      With the advent of new transistor devices and advanced die integration technologies to meet the growing demand on computing and communication density, new manufacturing test challenges emerge. At the same time, new technologies extend the scope of manufacturing testing beyond defect screening to yield learning and reliability.
      To cope with future challenges, the VLSI Test Technology Workshop (VTTW) provides an open forum for researchers and industrial practitioners to exchange innovative ideas on system, board, and device testing with design, manufacturing and field consideration in mind.